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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

  • Authors:Patrick EchlinC.E. FioriJoseph GoldsteinDavid C. JoyDale E. Newbury
  • Publisher:Plenum Press
  • Category:Book
  • List Price: $119.00
  • Buy New: $59.03
  • as of 5/20/2012 16:14 CDT details
  • You Save: $59.97 (50%)
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New (19) Used (23) from $14.53
  • Seller:bookaway
  • Sales Rank:1,528,397
  • Languages:English (Unknown), English (Original Language), English (Published)
  • Media:Hardcover
  • Number Of Items:1
  • Edition:1
  • Pages:466
  • Shipping Weight (lbs):1.6
  • Dimensions (in):0.9 x 0.6 x 0.1
  • Publication Date:March 31, 1986
  • ISBN:0306421402
  • EAN:9780306421402
  • ASIN:0306421402
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